Sem of Plastics Failure: Rem Von Kunststoffscheaden

Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations.

Author: Gottfried W. Ehrenstein
Binding Type: Hardcover
Publisher: Hanser Publications
Published: 09/01/2010
Pages: 262
Weight: 2lbs
Size: 10.70h x 7.90w x 0.60d
ISBN: 9781569905029