Radiation Effects & Soft Errors ...(V34)

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Author: Ronald D. Schrimpf
Binding Type: Hardcover
Publisher: World Scientific Publishing Company
Published: 08/03/2004
Series: Selected Topics in Electronics and Systems #34
Pages: 348
Weight: 1.5lbs
Size: 9.80h x 6.60w x 0.90d
ISBN: 9789812389404