Failure Analysis: High Technology Devices

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Author: Daniel J. D. Sullivan, Eric J. Carleton
Binding Type: Paperback
Publisher: de Gruyter
Published: 10/24/2022
Series: de Gruyter Stem
Pages: 128
Weight: 0.48lbs
Size: 9.61h x 6.69w x 0.28d
ISBN: 9781501524783