Advances in Optics of Charged Particle Analyzers: Part 2: Volume 233

Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

Author: Peter W. Hawkes
Binding Type: Hardcover
Publisher: Academic Press
Published: 05/21/2025
Series: Advances in Imaging and Electron Physics #233
Pages: 298
Weight: 1.34lbs
Size: 9.28h x 6.37w x 0.61d
ISBN: 9780443317200